Author： Grudin B. Plotnikov V. Smolyaninov N. Pustovalov E. Modin E.
Publisher： Springer Publishing Company
ISSN： 1064-8887
Source： Russian Physics Journal, Vol.52, Iss.11, 2009-11, pp. : 1205-1211
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Quantitative analysis of electron microscopic micrographs of multilayers
By Schuhrke T. Zweck J. Hoffmann H.
Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. :
Access to resources
Recommend
