Focused Ion-Beam Tomography

By Kubis A.J.   Shiflet G.J.   Dunn D.N.   Hull R.  

Metallurgical and Materials Transactions A, Vol. 35, Iss. 7, 2004-07 ,pp. : 1935-1943

Springer Publishing Company

Access to resources Recommend Favorite

Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique

By Prenitzer B.   Giannuzzi L.   Newman K.   Brown S.   Irwin R.   Stevie F.   Shofner T.  

Metallurgical and Materials Transactions A, Vol. 29, Iss. 9, 1998-09 ,pp. : 2399-2406

Springer Publishing Company

Access to resources Recommend Favorite

Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy

By Shankar S.   Riddle Y.   Makhlouf M.  

Metallurgical and Materials Transactions A, Vol. 34, Iss. 3, 2003-03 ,pp. : 705-707

Springer Publishing Company

Access to resources Recommend Favorite

Preparation of TEM samples by focused ion beam (FIB) techniques: applications to the study of clays and phyllosilicates in meteorites

By Lee M. R.   Bland P. A.   Graham G.  

Mineralogical Magazine, Vol. 67, Iss. 3, 2003-06 ,pp. : 581-592

Mineralogical Society

Access to resources Recommend Favorite

Ion Beam Induced Modifications of Biocompatible Polymer

By  

Solid State Phenomena, Vol. 2015, Iss. 239, 2015-09 ,pp. : 149-15

Trans Tech Publications

Access to resources Recommend Favorite