Dislocation microstructure and internal-stress measurements by convergent-beam electron diffraction on creep-deformed Cu and Al

Author: Kassner M.   Pérez-Prado M.   Long M.   Vecchio K.  

Publisher: Springer Publishing Company

ISSN: 1543-1940

Source: Metallurgical and Materials Transactions A, Vol.33, Iss.2, 2002-02, pp. : 311-317

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