Edge-to-edge matching of lattice planes and coupling of crystallography and migration mechanisms of planar interfaces

Author： Nie J.  

Publisher： Springer Publishing Company

ISSN： 1543-1940

Source： Metallurgical and Materials Transactions A, Vol.37, Iss.12, 2006-03, pp. : 841-849

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Edge-to-Edge Matching of Lattice Planes and Coupling of Crystallography and Migration Mechanisms of Planar Interfaces

By Nie J.F.  

Metallurgical and Materials Transactions A, Vol. 37, Iss. 3, 2006-03 ,pp. : 841-849

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-edge matching—The fundamentals

By Kelly P.   Zhang M.  

Metallurgical and Materials Transactions A, Vol. 37, Iss. 12, 2006-03 ,pp. : 833-839

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-Edge Matching—The Fundamentals

By Kelly P.M.   Zhang M.-X.  

Metallurgical and Materials Transactions A, Vol. 37, Iss. 3, 2006-03 ,pp. : 833-839

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-edge matching in thin films

By Detavernier C.   Lavoie C.  

Metallurgical and Materials Transactions A, Vol. 37, Iss. 12, 2006-03 ,pp. : 851-855

Springer Publishing Company

Access to resources Recommend Favorite

Edge-to-Edge Matching in Thin Films

By Detavernier C.   Lavoie C.  

Metallurgical and Materials Transactions A, Vol. 37, Iss. 3, 2006-03 ,pp. : 851-855

Springer Publishing Company

Access to resources Recommend Favorite