High-Temperature Creep Degradation of the AM1/NiAlPt/EBPVD YSZ System

Author: Riallant Fanny   Cormier Jonathan   Longuet Arnaud   Milhet Xavier   Mendez José  

Publisher: Springer Publishing Company

ISSN: 1543-1940

Source: Metallurgical and Materials Transactions A, Vol.45, Iss.1, 2014-01, pp. : 351-360

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Abstract