![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Gupta Mukul Gutberlet Thomas Gupta Rachana Gupta Ajay
Publisher: Springer Publishing Company
ISSN: 1547-7037
Source: Journal of Phase Equilibria & Diffusion, Vol.26, Iss.5, 2005-09, pp. : 458-465
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Neutron Reflectometry for the Investigation of Self-Diffusion in Amorphous Silicon
Defect and Diffusion Forum, Vol. 2015, Iss. 363, 2015-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
A SIMS Study on Self-Diffusion in Thin Nano-Crystalline Platinum Films
Defect and Diffusion Forum, Vol. 2015, Iss. 363, 2015-06 ,pp. :