Atomistic calculations of the electronic, thermal, and thermoelectric properties of ultra-thin Si layers

Author: Neophytou Neophytos   Karamitaheri Hossein   Kosina Hans  

Publisher: Springer Publishing Company

ISSN: 1569-8025

Source: Journal of Computational Electronics, Vol.12, Iss.4, 2013-12, pp. : 611-622

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Abstract