From atoms to product reliability: toward a generalized multiscale simulation approach

Author： Gerrer Louis   Ling Sanliang   Amoroso Salvatore   Asenov Plamen   Shluger Alexandre   Asenov Asen  

Publisher： Springer Publishing Company

ISSN： 1569-8025

Source： Journal of Computational Electronics, Vol.12, Iss.4, 2013-12, pp. : 638-650

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