3D Monte Carlo Analysis of Discrete Dopant Effects on Electron noise in Si Devices

Author： Dollfus P.   VeláZquez J.   Bournel A.   Galdin-Retailleau S.  

Publisher： Springer Publishing Company

ISSN： 1569-8025

Source： Journal of Computational Electronics, Vol.3, Iss.3-4, 2004-10, pp. : 311-315

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