A Quantum Mechanical Approach for the Simulation of Si/SiO2 Interface Roughness Scattering in Silicon Nanowire Transistors

Author： Wang Jing   Polizzi Eric   Ghosh Avik   Datta Supriyo   Lundstrom Mark  

Publisher： Springer Publishing Company

ISSN： 1569-8025

Source： Journal of Computational Electronics, Vol.3, Iss.3-4, 2004-10, pp. : 453-457

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