Computerized analysis of error patterns in digit span recall

Author: Woods David L.   Herron T. J.   Yund E. W.   Hink R. F.   Kishiyama M. M.   Reed Bruce  

Publisher: Routledge Ltd

ISSN: 1380-3395

Source: Journal of Clinical and Experimental Neuropsychology (Neuropsychology, Developm, Vol.33, Iss.7, 2011-08, pp. : 721-734

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