Nanoscale Measurement Techniques of Three-Dimensional Ferroelectric Polarization Using Scanning Nonlinear Dielectric Microscopy

Author： Odagawa Hiroyuki   Cho Yasuo  

Publisher： Taylor & Francis Ltd

ISSN： 0015-0193

Source： Ferroelectrics, Vol.268, Iss.1, 2002-01, pp. : 149-154

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Direct Domain Wall Thickness Measurement Using Scanning Nonlinear Dielectric Microscopy

By Cho Y.  

Ferroelectrics, Vol. 292, Iss. 1, 2003-01 ,pp. : 171-180

Taylor & Francis Ltd

Access to resources Recommend Favorite

Nanoscale domain switching and 3-dimensional mapping of ferroelectric domains by scanning force microscopy

By  

Le Journal de Physique IV, Vol. 08, Iss. PR9, 1998-12 ,pp. : Pr9-201-Pr9-204

Edp Sciences

Access to resources Recommend Favorite

Tbit/Inch 2 Data Storage Using Scanning Nonlinear Dielectric Microscopy

By Cho Yasuo  

Ferroelectrics, Vol. 292, Iss. 1, 2003-01 ,pp. : 51-58

Taylor & Francis Ltd

Access to resources Recommend Favorite

Observation of dopant profile of transistors using scanning nonlinear dielectric microscopy

By  

Journal of Physics: Conference Series , Vol. 209, Iss. 1, 2010-02 ,pp. : 274-277

IOP Publishing

Access to resources Recommend Favorite

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy

By  

Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. : 150-153

IOP Publishing

Access to resources Recommend Favorite