Dielectric Properties of Bi2Ti2O7 Films Grown on Si(100) Substrate by APMOCVD

Author: Wang H.   Shang S. X.   Yao W. F.   Hou Y.   Xu X. H.   Wang D.   Wang M.   Yu J. Z h.  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.271, Iss.1, 2002-01, pp. : 117-123

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Abstract