Author: Lo Veng Cheong Hu Zhan Ning
Publisher: Taylor & Francis Ltd
ISSN: 0015-0193
Source: Ferroelectrics, Vol.271, Iss.1, 2002-01, pp. : 327-332
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics∗
By CHANDRA P.
Ferroelectrics, Vol. 313, Iss. 1, 2004-01 ,pp. :
Thickness-dependent fracture behaviour of flexible ZnO : Al thin films
Journal of Physics D: Applied Physics, Vol. 44, Iss. 2, 2011-01 ,pp. :
Reactive Ion Beam Etching of PZT Thin Films
By Soyer C. Cattan E. Remiens D.
Ferroelectrics, Vol. 288, Iss. 1, 2003-01 ,pp. :