

Author: Abe Kohji Yamashita Keiji Tomita Yoshiharu Shigenari Takeshi Wang Ruiping Itoh Mitsuru
Publisher: Taylor & Francis Ltd
ISSN: 0015-0193
Source: Ferroelectrics, Vol.272, Iss.1, 2002-01, pp. : 155-160
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content








Light Scattering Study in Ferroelectric SrTi18O3
By Hasebe Hiroki Tsujimi Yuhji Wang Ruiping Itoh Mitsuru Yagi Toshirou
Ferroelectrics, Vol. 285, Iss. 1, 2003-06 ,pp. :


Origin of the Ferroelectricity in SrTi18O3 Studied by Raman Scattering
By Shigenari Takeshi Abe Kohji
Ferroelectrics, Vol. 369, Iss. 1, 2008-01 ,pp. :