Electrical Characteristics of Bi4Ti3O12 Ferroelectric Thin Films Annealed under Different Temperature for Applications in Nonvolatile Memory Devices

Author: Chen Kai-Huang   Diao Chien-Chen   Yang Cheng-Fu   Wang Bing-Xun  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.385, Iss.1, 2009-01, pp. : 46-53

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Abstract