Influence of Substrate Bias on the Structural and Dielectric Properties of Magnetron-Sputtered BaxSr1-xTiO3 Thin Films

Author： Riekkinen Tommi   Saijets Jan   Kostamo Pasi   Sajavaara Timo   Van Dijken Sebastiaan  

Publisher： Taylor & Francis Ltd

ISSN： 0015-0193

Source： Ferroelectrics, Vol.392, Iss.1, 2009-01, pp. : 3-12

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