

Author: Liu P. F. Meng X. J. Wang J. L. Chu J. H. Gemeiner P. Geiger S. Dkhil B.
Publisher: Taylor & Francis Ltd
ISSN: 0015-0193
Source: Ferroelectrics, Vol.405, Iss.1, 2010-01, pp. : 183-187
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content






By Tian L. Sun J. L. Meng X. J. Yang J. Wang J. L. Bai W. Yuan S. Z. Chu J. H.
Ferroelectrics, Vol. 423, Iss. 1, 2011-01 ,pp. :




By Chan Helen Lai Wah Wilson Ian Lau Sien Ting Leung Kin Yi Choy Chung Loong Sundaravel B.
Ferroelectrics, Vol. 273, Iss. 1, 2002-01 ,pp. :