Deep Level Transient Spectroscopy of Defects in High-Energy Light-Particle Irradiated Si

Author： Auret F.   Deenapanray Prakash  

Publisher： Taylor & Francis Ltd

ISSN： 1040-8436

Source： Critical Reviews in Solid State and Material Sciences, Vol.29, Iss.1, 2004-01, pp. : 1-44

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