Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices

Author： Kuntze S.   Ban D.   Sargent E.   Dixon-Warren St.   White J.   Hinzer K.  

Publisher： Taylor & Francis Ltd

ISSN： 1040-8436

Source： Critical Reviews in Solid State and Material Sciences, Vol.30, Iss.2, 2005-04, pp. : 71-124

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