APPLICABILITY OF THE MULTI-HIT MODEL TO CALCULATE THE TRACK ETCH RATE IN µm-SCALE IN CR-39 DETECTORS

Author: AWAD E. M.  

Publisher: Taylor & Francis Ltd

ISSN: 1042-0150

Source: Radiation Effects and Defects in Solids, Vol.158, Iss.7, 2003-01, pp. : 539-550

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Abstract