Ion-beam-treated strained AlGaN/GaN multi-quantum wells: HAADF-STEM, HRTEM, Raman and HRXRD characterizations

Author: Devaraju G.   Pathak A. P.   Srinivasa Rao N.   Saikiran V.   Wang D.   Scherer T.   Mishra A. K.   Kübel C.  

Publisher: Taylor & Francis Ltd

ISSN: 1042-0150

Source: Radiation Effects and Defects in Solids, Vol.167, Iss.8, 2012-08, pp. : 612-620

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Abstract