Temperature-Dependent Tunneling Current in NiSi2 Nanocrystals Embedded in Metal-Oxide-Semiconductor Structure

Author: Tsai Jenn-Kai   Yeh Bin-Hong   Meen Teen-Hang   Wu Tian-Chiuan  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.143, Iss.1, 2013-01, pp. : 24-31

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