Stress Effect on Critical Thickness in Ferroelectric Thin Films

Author: Zhang Jian   Wu Zhenhuai   Yin Zhen   Zhang Ming-Sheng  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.43, Iss.1, 2002-01, pp. : 19-30

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Abstract