The Thickness Dependence of the Electrical and Dielectric Properties in the Laser Ablated SrBi2Nb2O9 Thin Films

Author： Bhattacharyya S.   Victor P.   Laha A.   Krupanidhi S. B.  

Publisher： Taylor & Francis Ltd

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.50, Iss.1, 2002-01, pp. : 159-169

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