Quantitative Measurement of Dielectric Properties Using Scanning Nonlinear Dielectric Microscopy with Electro-Conductive Cantilever

Author： Ohara Koya   Cho Yasuo  

Publisher： Taylor & Francis Ltd

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.50, Iss.1, 2002-01, pp. : 209-217

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