Fabrication of polarization-dependent reflective metamaterial by focused ion beam milling

By Kim J   Lee Y U   Kang Boyoung   Woo J H   Choi E Y   Kim E S   Gwon M   Kim D-W   Wu J W  

Nanotechnology, Vol. 24, Iss. 1, 2013-01 ,pp. : 15306-15311

IOP Publishing

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Growth of single crystal silver thin film induced by incident ion beam bombardment

By Gu Y.   Zeng F.   Pan F.  

Materials Science and Technology, Vol. 23, Iss. 2, 2007-02 ,pp. : 247-249

Maney Publishing

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High-T_c Josephson junctions fabricated by focused ion beam direct milling

By Wu C H   Jhan F J   Chen J H   Jeng J T  

Superconductor Science and Technology, Vol. 26, Iss. 2, 2013-02 ,pp. : 25010-25014

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Multi-channel Andreev reflection in Co–W nanocontacts fabricated using focused electron/ion beam induced deposition

By Sharma N   Vugts P   Daniels C   Keuning W   Kohlhepp J T   Kurnosikov O   Koopmans B  

Nanotechnology, Vol. 25, Iss. 49, 2014-12 ,pp. : 495201-495207

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Fabricating micromilling tool using wire electrodischarge grinding and focused ion beam sputtering

By Ali M.   Ong A.  

The International Journal of Advanced Manufacturing Technology, Vol. 31, Iss. 5-6, 2006-12 ,pp. : 501-508

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