Understanding Thickness Effects in Thin Film Capacitors

Author: LOOKMAN A.   BOWMAN R.   GREGG J.   SCOTT J.   DAWBER MATT   RUEDIGER A.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.61, Iss.1, 2004-01, pp. : 51-58

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract