CHARACTERIZATION OF IMPRINT BEHAVIOR FOR THE SrBi 2 Ta 2 O 9 THIN FILMS

Author： ZHANG ZHIGANG   XIE DAN   ZHU JUN   REN TIANLING   LIU ZHIHONG  

Publisher： Taylor & Francis Ltd

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.79, Iss.1, 2006-11, pp. : 245-251

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