ELECTRICAL CHARACTERIZATION AND RELIABILITY OF LANTHANUM DOPED PZT THIN FILMS CAPACITORS

Author： Chentir M. T.   Bouyssou E.   Ventura L.   Guegan G.   Anceau C.  

Publisher： Taylor & Francis Ltd

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.96, Iss.1, 2008-01, pp. : 75-81

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