THE FABRICATION AND CHARACTERIZATION OF METAL-OXIDE-SILICON CAPACITORS AND FIELD-EFFECT TRANSISTORS USING Dy2O3 AND Sm2O3 GATE DIELECTRICS

Author: Hwang Yu-Ren   Chang Ingram Yin-ku   Wang Ming-tsong   Lee Joseph Ya-min  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.97, Iss.1, 2008-01, pp. : 111-120

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