Author: Batchelor S.N. McLauchlan K.A. Shkrob I.A.
Publisher: Taylor & Francis Ltd
ISSN: 1362-3028
Source: Molecular Physics, Vol.75, Iss.3, 1992-02, pp. : 501-529
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Reaction yield detected magnetic resonance in exciplex systems
By Batchelor S.N. Mclauchlan K.A. Shkrob I.A.
Molecular Physics, Vol. 75, Iss. 3, 1992-02 ,pp. :
By Batchelor S.N. McLauchlan K.A. Shkrob I.A.
Molecular Physics, Vol. 77, Iss. 1, 1992-09 ,pp. :
Electrically detected magnetic resonance in photoexcited fullerenes
By Eickelkamp T. Roth S. Mehring M.
Molecular Physics, Vol. 95, Iss. 5, 1998-12 ,pp. :
Imaging of Electrically Detected Magnetic Resonance of a Silicon Wafer
By Sato T. Yokoyama H. Ohya H. Kamada H.
Journal of Magnetic Resonance, Vol. 153, Iss. 1, 2001-11 ,pp. :
The photomagnetic effect detected by nuclear magnetic resonance
By Pleshakov I.
Technical Physics Letters, Vol. 29, Iss. 6, 2003-06 ,pp. :