Rapid rotation of micron and submicron dielectric particles measured using optical tweezers

Author: Rowe Alexander D.   Leake Mark C.   Morgan Hywel   Berry Richard M.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3044

Source: Journal of Modern Optics, Vol.50, Iss.10, 2003-01, pp. : 1539-1554

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Abstract