Bunched electron beam properties measurement by means of single-shot multibeam cross-correlation technique

Author: Chaltikyan V. O.   Hovhannisyan D. L.   Laziev E. M.   Melikyan A. O.   Vardanyan A. O.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3044

Source: Journal of Modern Optics, Vol.53, Iss.7, 2006-05, pp. : 919-929

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Abstract