Subthreshold analysis of nanoscale FinFETs for ultra low power application using high-k materials

Author: Nirmal D.   Vijayakumar P.   Samuel P. Patrick Chella   Jebalin Binola K.   Mohankumar N.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.100, Iss.6, 2013-06, pp. : 803-817

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Abstract