Within-field wheat yield prediction from IKONOS data: a new matrix approach

Author: Enclona E. A.   Thenkabail P. S.   Celis D.   Diekmann J.  

Publisher: Taylor & Francis Ltd

ISSN: 1366-5901

Source: International Journal of Remote Sensing, Vol.25, Iss.2, 2004-01, pp. : 377-388

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Abstract