Author: Seelig H. -D. Hoehn A. Stodieck L. S. Klaus D. M. Adams III W. W. Emery W. J.
Publisher: Taylor & Francis Ltd
ISSN: 1366-5901
Source: International Journal of Remote Sensing, Vol.29, Iss.13, 2008-01, pp. : 3701-3713
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Abstract
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