Validating MODIS surface reflectance based on field spectral measurements

Author: Liu Xuefeng   Li Xianhua   Zeng Qihong   Mao Jianhua   Chen Qiang   Guan Chunlei  

Publisher: Taylor & Francis Ltd

ISSN: 1366-5901

Source: International Journal of Remote Sensing, Vol.31, Iss.6, 2010-02, pp. : 1645-1659

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Abstract