Evaluation of Barrier Width by Low-Frequency Capacitance Measurements for MoO3-doped p-Type C60 Films

Author: Yoshioka Tadashi   Kubo Masayuki   Ishiyama Norihiro   Kaji Toshihiko   Hiramoto Masahiro  

Publisher: Taylor & Francis Ltd

ISSN: 1542-1406

Source: Molecular Crystals and Liquid Crystals, Vol.579, Iss.1, 2013-09, pp. : 1-4

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Abstract