An Improved Iem Model for Bistatic Scattering From Rough Surfaces

Author: Fung A.K.   Liu W.Y.   Chen K.S.   Tsay M.K.  

Publisher: Taylor & Francis Ltd

ISSN: 1569-3937

Source: Journal of Electromagnetic Waves and Applications, Vol.16, Iss.5, 2002-01, pp. : 689-702

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Abstract