A Novel Technique for Localizing the Scatterer in Inverse Profiling of Two Dimensional Circularly Symmetric Dielectric Scatterers Using Degree of Symmetry and Neural Networks

Author： Thomas V. Gopakumar C. Yohannan J. Lonappan A. Bindu G. Praveen Kumar A. V. Hamsakutty V. Mathew K. T.

Publisher： Taylor & Francis Ltd

ISSN： 1569-3937

Source： Journal of Electromagnetic Waves and Applications, Vol.19, Iss.15, 2005-11, pp. : 2113-2121

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