Modeling of SiC MESFETs by Using Support Vector Machine Regression

Author: Xu Y.   Guo Y.   Xu R.   Wu Y.  

Publisher: Taylor & Francis Ltd

ISSN: 1569-3937

Source: Journal of Electromagnetic Waves and Applications, Vol.21, Iss.11, 2007-09, pp. : 1489-1498

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Abstract