Thin Film Materials Characterization Using TE Modes Cavity

Author： Le Floch J.-M.   Houndonougbo F.   Madrangeas V.   Cros D.   Guilloux-Viry M.   Peng W.  

Publisher： Taylor & Francis Ltd

ISSN： 1569-3937

Source： Journal of Electromagnetic Waves and Applications, Vol.23, Iss.4, 2009-02, pp. : 549-559

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