Experimental and Simulation Investigation of RFID Blind Spots

Author： Loo C. H.   Elsherbeni A. Z.   Yang F.   Kajfez D.  

Publisher： Taylor & Francis Ltd

ISSN： 1569-3937

Source： Journal of Electromagnetic Waves and Applications, Vol.23, Iss.5-6, 2009-04, pp. : 747-760

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