Interferometry for Ellipso-Height-Topometry – Part 1: Coherence scanning on the base of spacial coherence

Author: Leonhardt K   Droste U   Tiziani H J  

Publisher: Urban & Fischer

ISSN: 0030-4026

Source: Optik – International Journal for Light and Electron Optics, Vol.113, Iss.12, 2003-03, pp. : 513-519

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Abstract