Ultimate resolution limits for scanning electron microscope immersion objective lenses

ISSN： 0030-4026

Source： Optik – International Journal for Light and Electron Optics, Vol.113, Iss.2, 2002-04, pp. : 67-77

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Resolution and Metallurgical Studies with a Scanning Electron Acoustic Microscope

By Richey C. A. Curtis G. J.

Acta Acustica united with Acustica, Vol. 79, Iss. 2, 1993-09 ,pp. : 175-180

S. Hirzel Verlag

Access to resources Recommend Favorite

HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE

Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. : C6-271-C6-275

Edp Sciences

Access to resources Recommend Favorite

X-ray microanalysis in the environmental scanning electron microscope (ESEM): Small size particles analysis limits

Le Journal de Physique IV, Vol. 12, Iss. 6, 2002-07 ,pp. : 341-346

Edp Sciences

Access to resources Recommend Favorite

STEM electron tomography in the Scanning Electron Microscope

Journal of Physics: Conference Series , Vol. 644, Iss. 1, 2015-10 ,pp. : 47-50

IOP Publishing

Access to resources Recommend Favorite

Distance resolution of the scanning acoustic air microscope

By Kojro Z. Kim T.J. Lippold G. Gudra T. Grill W.

Ultrasonics, Vol. 35, Iss. 8, 1998-01 ,pp. : 563-567

Elsevier

Access to resources Recommend Favorite