Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

Author： Alvarez J   Boutchich M   Kleider J P   Teraji T   Koide Y  

Publisher： IOP Publishing

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.47, Iss.35, 2014-09, pp. : 355102-355111

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model

By Wang Dong   Yu Peng   Wang Feifei   Chan Ho-Yin   Zhou Lei   Dong Zaili   Liu Lianqing   Li Wen Jung  

Sensors, Vol. 15, Iss. 2, 2015-02 ,pp. : 3409-3425

MDPI

Access to resources Recommend Favorite

Ultradisperse diamond cluster aggregation studied by atomic force microscopy

By Aleksenskii A.   Osipov V.   Dideikin A.   Vul’ A.   Adriaenssens G.   Afanas’ev V.  

Technical Physics Letters, Vol. 26, Iss. 9, 2000-09 ,pp. : 819-821

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor

By Hussain Danish   Wen Yongbing   Zhang Hao   Song Jianmin   Xie Hui  

Sensors, Vol. 18, Iss. 1, 2018-01 ,pp. : 100-100

MDPI

Access to resources Recommend Favorite

DIRECT OBSERVATION OF ATOMIC IMAGE OF HIGH Tc SUPERCONDUCTORS BY FIELD ION MICROSCOPY

By  

Le Journal de Physique Colloques, Vol. 50, Iss. C8, 1989-11 ,pp. : C8-487-C8-488

Edp Sciences

Access to resources Recommend Favorite

Surface potential imaging of CNT-FET devices by scanning Kelvin probe microscopy

By  

Journal of Physics: Conference Series , Vol. 100, Iss. 5, 2008-03 ,pp. : 347-350

IOP Publishing

Access to resources Recommend Favorite