Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance

Author： Jun-Bo Gong   Wei-Le Dong   Ru-Cheng Dai   Zhong-Ping Wang   Zeng-Ming Zhang   Ze-Jun Ding  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.8, 2014-08, pp. : 87802-87806

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