Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO2 heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies

Publisher： IOP Publishing

ISSN： 1468-6996

Source： Science and Technology of Advanced Materials, Vol.14, Iss.4, 2013-08, pp. : 143-154

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