Improved x-ray reflectivity calculations for rough surfaces and interfaces

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IOP Conference Series: Materials Science and Engineering, Vol. 24, Iss. 1, 2011-09 ,pp. : 54-74

IOP Publishing

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Fast X-ray reflectivity measurement using a cooling PIN photodiode

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IOP Conference Series: Materials Science and Engineering, Vol. 24, Iss. 1, 2011-09 ,pp. : 195-197

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Aberration effects in quick X-Ray reflectivity of curved samples

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IOP Conference Series: Materials Science and Engineering, Vol. 24, Iss. 1, 2011-09 ,pp. : 97-109

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Finite-element calculations of the lattice rotation field of a tensile-loaded nickel-based alloy multicrystal and comparison with topographical X-ray diffraction measurements

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In-situ X-ray reflectivity measurement of polyvinyl acetate thin films during glass transition

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IOP Conference Series: Materials Science and Engineering, Vol. 24, Iss. 1, 2011-09 ,pp. : 92-96

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